Manufacturer Part Number | SN74BCT8373ADWR |
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Manufacturer | Texas Instruments |
Product Category | Logic - Specialty Logic |
Available Quantity | 146540 Pieces |
Unit Price | Quote by Email ([email protected]) |
Description | IC SCAN TEST DEVICE LATCH 24SOIC |
Lead Free Status / RoHS Status | Lead free / RoHS Compliant |
Moisture Sensitivity Level (MSL) | 1 (Unlimited) |
Production Status (Lifecycle) | In Production |
Delivery Time | 1-2 Days |
Date Code (D/C) | New |
Datasheet Download | SN74BCT8373ADWR.pdf |
Part Number | SN74BCT8373ADWR |
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Manufacturer Lead time | 6-8 weeks |
Condition | New & Unused, Original Sealed |
Part Status | Obsolete |
Logic Type | Scan Test Device with D-Type Latches |
Supply Voltage | 4.5 V ~ 5.5 V |
Number of Bits | 8 |
Operating Temperature | 0°C ~ 70°C |
Mounting Type | Surface Mount |
Package / Case | 24-SOIC (0.295", 7.50mm Width) |
Supplier Device Package | 24-SOIC |
Weight | 0.001 KG |
Application | Email for details |
Replacement Part | SN74BCT8373ADWR |
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